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1

Quantification and macroscopic modeling of the nonlinear viscoelastic behavior of strained gels with varying fibrin concentrations

Benkherourou, M., Gumery, P.-Y., Tranqui, L., Tracqui, P.

Journal:

IEEE Transactions on Biomedical Engineering

Year:

2000

Language:

english

File:

PDF, 244 KB

english, 2000

2

Désorption de césium induite par échauffement laser a la surface du tungstène w(100)

M. Djabi, A. Fort, O. Benkherourou, J.P. Deville

Journal:

Annales de Chimie Science des Matériaux

Year:

1999

File:

PDF, 369 KB

1999

3

XPS Sputter Depth Profiling Applid to the Analysis of Si/SiO2, Si/SiOxNy and Si/Si3N4

Benkherourou, O., Deville, J.P.

Journal:

Solid State Phenomena

Year:

1991

File:

PDF, 370 KB

1991

4

Distribution of intermediate oxidation states at the silicon/silicon dioxide interface obtained by low-energy ion implantation

Benkherourou, O.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1988

Language:

english

File:

PDF, 561 KB

english, 1988

5

SPIE Proceedings [SPIE Tenth International Topical Meeting on Education and Training in Optics and Photonics - Ottawa, Ontario, Canada (Sunday 3 June 2007)] Tenth International Topical Meeting on Education and Training in Optics and Photonics - Losses influence of a Fabry Perot resonator on the effect of the optical multistability in a laser saturable absorber with a homogenous widening

Nantel, Marc, Djabi, S., Boudoukha, H., Djabi, M., Benkherourou, O.

Year:

2015

Language:

english

File:

PDF, 37 KB

english, 2015

6

SPIE Proceedings [SPIE Ninth International Topical Meeting on Education and Training in Optics and Photonics - Marseille, France (Monday 24 October 2005)] Ninth International Topical Meeting on Education and Training in Optics and Photonics - Bistabilité optique dans un laser à absorbant saturable trimode

Flory, François, Djabi, S., Djabi, M., Benkherourou, O.

Year:

2015

Language:

french

File:

PDF, 294 KB

french, 2015

7

Analysis of photoemission lines in silicon nitrided layers formed by low-energy nitrogen ion implantation in silicon

O. Benkherourou, S. Sahnoune, M. Djabi, J-P. Deville

Journal:

Year:

1999

Language:

english

File:

PDF, 206 KB

english, 1999

8

Ar+ and He+-ion influence on Si2p and O1s atomic lines an XPS study

O Benkherourou, JP Deville

Journal:

Year:

1998

Language:

english

File:

PDF, 391 KB

english, 1998

9

Standardization of a Method for Characterizing Low-Concentration Biogels: Elastic Properties of Low-Concentration Agarose Gels

Benkherourou, M., Rochas, C., Tracqui, P., Tranqui, L., Guméry, P. Y.

Journal:

Journal of Biomechanical Engineering

Year:

1999

Language:

english

File:

PDF, 484 KB

english, 1999

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